Toggle navigation
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Databases
Publications
Searching
My bookmarks
0
punktdefektid (subject term)
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
Add criteria
Advanced search
filter
Clear
×
types of item
book
..
journal article
..
newspaper article
..
book article
..
dissertation
..
Open Access
..
Scientific publications
..
year
year of publication
Loading..
author
Loading..
TalTech department
Loading..
subject term
Loading..
series
Loading..
name of the person
Loading..
keyword
Loading..
Clear
Number of records
12
Look more..
(1/1)
Export
export all inquiry results
(12)
Save TXT fail
Save PDF fail
print
Open for editing with marked entries
my bookmarks
display
Bibliographic view
Short view
sort
author ascending
author descending
year of publication ascending
year of publication descending
title ascending
title descending
1
book article
Defects in Cl and Na doped CdTe monograin powders
Altosaar, Mare
;
Kukk, Peeter-Enn
;
Raudoja, Jaan
;
Mellikov, Enn
E-MRS Spring Meeting : Strasbourg, 1999 : abstracts
1999
/
p. O-32
https://www.sciencedirect.com/science/article/abs/pii/S0040609099008135
book article
2
journal article
Impurity interaction with point defects in the Si-SiO2 structures and its influence on the interface properties
Kropman, Daniel
;
Mellikov, Enn
;
Kärner, T.
;
Ugaste, Ülo
;
Laas, Tõnu
;
Heinmaa, I.
;
Medvid, A.
Materials science and engineering : B
2006
/
p. 222-226 : ill
https://www.sciencedirect.com/science/article/pii/S0921510706004375
journal article
3
journal article
Influence of point defects on physical qualities of semiconductors
Altosaar, Mare
;
Buschmann, Felix
;
Erm, Ants
;
Krustok, Jüri
;
Kukk, Peeter-Enn
;
Lõo, A.
;
Mädasson, Jaan
;
Tomson, A.
Journal of materials and product. technology
1991
journal article
4
journal article
Interaction between point defects in the Si-Si=2 system
Kropman, Daniel
;
Kärner, T.
;
Samoson, Ago
;
Heinmaa, I.
;
Mellikov, Enn
Nuclear instruments & methods in physics research. Section B
2002
/
p. 78-82
https://www.sciencedirect.com/science/article/pii/S0168583X0100862X
journal article
5
book article
Interaction between point defects in the Si-SiO2 system during the process of its formation
Kropman, Daniel
;
Kärner, T.
;
Samoson, Ago
;
Heidmaa, I.
;
Ugaste, Ülo
;
Mellikov, Enn
Defect and Diffusion Forum
2001
/
p. 1737-1744
https://www.sciencedirect.com/science/article/abs/pii/S0168583X0100862X
book article
6
journal article
Interaction of point defects with impurities in the Si-SiO2 system and its influence on the interface properties
Kropman, Daniel
;
Mellikov, Enn
;
Kärner, Tiit
;
Heinmaa, Ivo
;
Laas, Tõnu
;
Londos, Charalampos
;
Misiuk, Andrzej
Solid state phenomena
2011
/
p. 263-266
https://www.sciencedirect.com/science/article/pii/S0040609009014564
journal article
7
journal article
Interaction of point defects with impurities in the Si-SiO2 system and its influence on the interface properties
Kropman, Daniel
;
Kärner, Tiit
;
Dolgov, Sergei
;
Heinmaa, Ivo
;
Laas, Tõnu
;
Londos, Charalampos
Physica status solidi (c)
2011
/
p. 694-696 : ill
https://www.sciencedirect.com/science/article/pii/S0040609009014564
journal article
8
book article
Interaktsioon punktdefektide ja lisandite vahel süsteemis Si-SiO2 ja nende mõju piirpinna omadustele : [ettekande sisukokkuvõte]
Kropman, Daniel
;
Kärner, T.
;
Heinmaa, I.
Eesti Füüsika Seltsi aastaraamat 2008
2009
/
lk. 119-120
book article
9
book article
Point defects interaction with extended defects and impurities and its influence on the Si-SiO2 system properties
Kropman, Daniel
;
Arbu, Uno
;
Kärner, T.
;
Ugaste, Ülo
;
Mellikov, Enn
;
Kauk, Marit
;
Heinmaa, I.
;
Samoson, Ago
;
Medvid, A.
Gettering and defect engineering in semiconductor technology. XI
2005
/
p. 333-338 : ill
https://www.researchgate.net/publication/243760197_Point_Defects_Interaction_with_Extended_Defects_and_Impurities_and_Its_Influence_on_the_Si-SiO_2_System_Properties
book article
10
book article
Point defects interaction with extended defects in the Si-SiO2 system [Electronic resource]
Kropman, Daniel
;
Kärner, T.
;
Abru, Uno
;
Ugaste, Ülo
;
Mellikov, Enn
Proceedings IVC-16 : Venice, 2004
2004
/
p. SS1-TuP394 [CD-ROM]
https://www.researchgate.net/publication/243760197_Point_Defects_Interaction_with_Extended_Defects_and_Impurities_and_Its_Influence_on_the_Si-SiO_2_System_Properties
book article
11
journal article EST
/
journal article ENG
Solid electrolytes for fluoride ion batteries : ionic conductivity in polycrystalline tysonite-type fluorides
Rongeat, Carine
;
Reddy, M. Anji
;
Witter, Raiker
;
Fichtner, Maximilian
ACS applied materials and interfaces
ACS applied materials & interfaces
2014
/
p. 2103-2110 : ill
https://doi.org/10.1021/am4052188
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
12
dissertation
Точечные дефекты и процессы их образования в сульфидах кадмия и цинка : автореферат ... кандидата химических наук (02.00.04)
Mädasson, Jaan vt.ka Raudoja, Jaan
1987
https://www.ester.ee/record=b1521477*est
dissertation
Number of records 12, displaying
1 - 12
subject term
1
1.
punktdefektid
×
match
starts with
ends with
containes
sort
Relevance
ascending
descending
year of publication
author
TalTech department
subject term
series
name of the person
keyword
Otsing
Valikud
0
year of publication
AND
OR
NOT
author
AND
OR
NOT
TalTech department
AND
OR
NOT
subject term
AND
OR
NOT
series
AND
OR
NOT
name of the person
AND
OR
NOT
keyword
AND
OR
NOT