Targeting conditional operations in sequential test pattern generation

statement of authorship
Jaan Raik, Raimund Ubar
source
9th European Test Symposium : ETS'04 : Congress Center, Ajaccio, Corsica, France, May 23-26, 2004
location of publication
[S.l.]
publisher
year of publication
pages
p. 17-18 : ill
conference name, date
9th IEEE European Test Symposium, May 23-26, 2004
conference location
Corsica, France
notes
Bibliogr.: 4 ref
language
inglise
Raik, J., Ubar, R.-J. Targeting conditional operations in sequential test pattern generation // 9th European Test Symposium : ETS'04 : Congress Center, Ajaccio, Corsica, France, May 23-26, 2004. [S.l.] : IEEE, 2004. p. 17-18 : ill.