Diagnosis and correction of multiple design errors using critical path tracing and mutation analysis
author
Hantson, Hanno
Repinski, Urmas
Raik, Jaan
Jenihhin, Maksim
Ubar, Raimund-Johannes
statement of authorship
Hanno Hantson, Urmas Repinski, Jaan Raik, Maksim Jenihhin, Raimund Ubar
source
LATW 2012 : 13th IEEE Latin-American Test Workshop proceedings : April 10th-13th, 2012, Quito, Ecuador
location of publication
[S.l.]
publisher
IEEE
year of publication
2012
pages
[6 p.] : ill
conference name, date
LATW 2012: 13th IEEE Latin-American Test Workshop, April 10-13, 2012
conference location
Quito, Ecuador
ISBN
978-1-4673-2356-7
notes
Bibliogr.: 13 ref
language
inglise