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LATW 2012 : 13th IEEE Latin-American Test Workshop proceedings : April 10th-13th, 2012, Quito, Ecuador (source)
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book article
About robustness of test patterns regarding multiple faults
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
LATW 2012 : 13th IEEE Latin-American Test Workshop proceedings : April 10th-13th, 2012, Quito, Ecuador
2012
/
p. 86-91 : ill
book article
2
book article
Diagnosis and correction of multiple design errors using critical path tracing and mutation analysis
Hantson, Hanno
;
Repinski, Urmas
;
Raik, Jaan
;
Jenihhin, Maksim
;
Ubar, Raimund-Johannes
LATW 2012 : 13th IEEE Latin-American Test Workshop proceedings : April 10th-13th, 2012, Quito, Ecuador
2012
/
[6 p.] : ill
book article
3
book article
PSL assertion checkers synthesis with ASM based HLS tool ABELITE
Jenihhin, Maksim
;
Baranov, Samary
;
Raik, Jaan
;
Tihhomirov, Valentin
LATW 2012 : 13th IEEE Latin-American Test Workshop proceedings : April 10th-13th, 2012, Quito, Ecuador
2012
/
[6 p.] : ill
https://ieeexplore.ieee.org/document/6261251
book article
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