Comparison of two approaches to improve functional BIST fault coverage

statement of authorship
Sergei Kostin, Raimund Ubar, Maksim Gorev, Gunnar Mägi
location of publication
Tallinn
year of publication
pages
p. 105-108 : ill
conference name, date
2014 14th Biennial Baltic Electronics Conference, October 6-8, 2014
conference location
Tallinn University of Technology
subject term
keyword
functional BIST
hybrid BIST
test point insertion
ISSN
1736-3705
ISBN
978-9949-23-672-5
notes
Bibliogr.: 26 ref
TTÜ department
language
inglise
Kostin, S., Ubar, R., Gorev, M., Mägi, G. Comparison of two approaches to improve functional BIST fault coverage // BEC 2014 : 2014 14th Biennial Baltic Electronics Conference : proceedings of the 14th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 6-8, 2014, Tallinn, Estonia. Tallinn : Tallinn University of Technology, 2014. p. 105-108 : ill.