Latest trends in hardware security and privacy
author                    
                    
Di Natale, Giorgio
                            
                            
Regazzoni, Francesco
                            
                            
Albanese, Vincent
                            
                            
Lhermet, Frank
                            
                            
Loisel, Yann
                            
                            
Sensaoui, Abderrahmane
                            
                            
                    
statement of authorship                    
                    
Giorgio Di Natale, Francesco Regazzoni, Vincent Albanese, Frank Lhermet, Yann Loisel, Abderrahmane Sensaoui, Samuel Pagliarini
                            
                    
source                    
                    
33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) : ESA-ESRIN, Italy (On-line Virtual Event),October 19–21, 2020
                            
                    
publisher                    
                    
                
year of publication                    
                    
                
pages                    
                    
4 p. : ill
                            
                    
conference name, date                    
                    
33rd IEEE International Symposium on Defect and Fault Tolerance in VLSIand Nanotechnology Systems (DFT), October 19–21, 2020
                            
                    
conference location                    
                    
Frascati, Italy
                            
                    
subject term                    
                    
                
keyword                    
                    
                
ISBN                    
                    
978-1-7281-9457-8
                            
                    
notes                    
                    
Bibliogr.: 15 ref
                            
                    
Open Access                    
                    
Open Access
                            
                    
scientific publication                    
                    
teaduspublikatsioon
                            
                    
classifier                    
                    
                
TalTech department                    
                    
                
language                    
                    
inglise
                            
                    
                Reserch Group
            
            
        
                                    Di Natale, G., Regazzoni, F., Albanese, V., Pagliarini, S. et al. Latest trends in hardware security and privacy // 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) : ESA-ESRIN, Italy (On-line Virtual Event),October 19–21, 2020. : IEEE, 2020. 4 p. : ill.