Latest trends in hardware security and privacy
autor                    
                    
Di Natale, Giorgio
                            
                            
Regazzoni, Francesco
                            
                            
Albanese, Vincent
                            
                            
Lhermet, Frank
                            
                            
Loisel, Yann
                            
                            
Sensaoui, Abderrahmane
                            
                            
                    
vastutusandmed                    
                    
Giorgio Di Natale, Francesco Regazzoni, Vincent Albanese, Frank Lhermet, Yann Loisel, Abderrahmane Sensaoui, Samuel Pagliarini
                            
                    
allikas                    
                    
33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) : ESA-ESRIN, Italy (On-line Virtual Event),October 19–21, 2020
                            
                    
kirjastus/väljaandja                    
                    
                
ilmumisaasta                    
                    
                
leheküljed                    
                    
4 p. : ill
                            
                    
konverentsi nimetus, aeg                    
                    
33rd IEEE International Symposium on Defect and Fault Tolerance in VLSIand Nanotechnology Systems (DFT), October 19–21, 2020
                            
                    
konverentsi toimumispaik                    
                    
Frascati, Italy
                            
                    
võtmesõna                    
                    
                
ISBN                    
                    
978-1-7281-9457-8
                            
                    
märkused                    
                    
Bibliogr.: 15 ref
                            
                    
Open Access                    
                    
Open Access
                            
                    
teaduspublikatsioon                    
                    
teaduspublikatsioon
                            
                    
klassifikaator                    
                    
                
TTÜ struktuuriüksus                    
                    
                
keel                    
                    
inglise
                            
                    
                Uurimisrühm
            
            
        
                                    Di Natale, G., Regazzoni, F., Albanese, V., Pagliarini, S. et al. Latest trends in hardware security and privacy // 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) : ESA-ESRIN, Italy (On-line Virtual Event),October 19–21, 2020. : IEEE, 2020. 4 p. : ill.