An approach for PSL assertion coverage analysis with high-level decision diagrams
author
Jenihhin, Maksim
Raik, Jaan
Ubar, Raimund-Johannes
Shchenova, Tatjana
statement of authorship
Maksim Jenihhin, Jaan Raik, Raimund Ubar, Tatjana Shchenova
source
Proceedings of IEEE East-West Design & Test Symposium (EWDTS'10) : St. Petersburg, Russia, September 17-20, 2010
location of publication
Kharkov
publisher
Kharkov National University of Radioelectronics
year of publication
2010
pages
p. 13-16 : ill
conference name, date
IEEE East-West Design & Test Symposium (EWDTS'10), September 17-20, 2010
conference location
St. Petersburg, Russia
url
https://ieeexplore.ieee.org/document/5742048
subject term
disain
simulatsioon
kinnitusdetailid
skeemid
testimine
notes
Bibliogr.: 15 ref
language
inglise