Defect-oriented test generation and fault simulation in the environment of MOSCITO
author
Schneider, Andre
Diener, Karl-Heinz
Gramatova, Elena
Fisherova, Maria
Ivask, Eero
Ubar, Raimund-Johannes
Pleskacz, Witold A.
Kuzmicz, W.
statement of authorship
A.Schneider, K.-H.Diener, E.Gramatova, M.Fisherova, E.Ivask, R.Ubar, W.Pleskacz, W.Kuzmicz
source
BEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia
location of publication
Tallinn
publisher
[Tallinn Technical University]
year of publication
2002
pages
p. 303-306 : ill
ISBN
9985-59-292-1
notes
Bibliogr.: 12 ref