Defect-oriented fault simulation and test generation in digital circuits
author
Kuzmicz, W.
Pleskacz, Witold A.
Raik, Jaan
Ubar, Raimund-Johannes
statement of authorship
W.Kuzmicz, W.Pleskacz, J.Raik, R.Ubar
source
IEEE ISQED 2001 : proceedings of the IEEE 2001 2nd International Symposium on Quality Electronic Design : March 26-28, 2001, San Jose, California
location of publication
Los Alamitos, CA
publisher
IEEE Computer Society
year of publication
2001
pages
p. 365-371
ISBN
0-7695-1025-6
notes
Bibliogr.: 10 ref