Fault oriented test pattern generation for sequential circuits using genetic algorithms
author
Ivask, Eero
Raik, Jaan
Ubar, Raimund-Johannes
statement of authorship
E.Ivask, R.Ubar, J.Raik
source
IEEE European Test Workshop
location of publication
Cascais
year of publication
2000
pages
p. 319-320
subject term
elektriahelad
testimine
algoritmid
vead
language
inglise