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Wear-out failure analysis of an impedance-source PV microinverter based on system-level electrothermal modeling

author
Shen, Yanfeng
Chub, Andrii
Wang, Huai
Vinnikov, Dmitri
Liivik, Elizaveta
Blaabjerg, Frede
statement of authorship
Yanfeng Shen, Andrii Chub, Huai Wang, Dmitri Vinnikov, Elizaveta Liivik, Frede Blaabjerg
source
IEEE transactions on industrial electronics
publisher
IEEE
journal volume number month
vol. 66, 5
year of publication
2019
pages
p. 3914-3927
url
https://doi.org/10.1109/TIE.2018.2831643
subject term
inverterid
töökindlus
kulumine (tehnika)
modelleerimine (teadus)
keyword
electrothermal modeling
photovoltaic (PV) microinverter (MI)
reliability
wear-out
ISSN
0278-0046
notes
Bibliogr.: 61 ref
Open Access
Open Access
scientific publication
teaduspublikatsioon
classifier
1.1
Scopus
Journal metrics at Scopus
Article at Scopus
WOS
Journal metrics at WOS
Article at WOS
category (general)
Engineering
category (sub)
Engineering. Electrical and electronic engineering
Engineering. Control and systems engineering
quartile
Q1
TalTech department
elektroenergeetika ja mehhatroonika instituut
language
inglise
Reserch Group
Power electronics group
Shen, Y., Chub, A., Wang, H., Vinnikov, D., Liivik, E., Blaabjerg, F. Wear-out failure analysis of an impedance-source PV microinverter based on system-level electrothermal modeling // IEEE transactions on industrial electronics (2019) vol. 66, 5, p. 3914-3927. https://doi.org/10.1109/TIE.2018.2831643