Rejuvenation of NBTI-impacted processors using evolutionary generation of assembler programs
author
Pellerey, Francesco
Jenihhin, Maksim
Squillero, Giovanni
Raik, Jaan
Sonza Reorda, Matteo
Tihhomirov, Valentin
Ubar, Raimund-Johannes
statement of authorship
F. Pellerey, M. Jenihhin, G. Squillero, J. Raik, M. Sonza Reorda, V. Tihhomirov, R. Ubar
source
2016 IEEE 25th Asian Test Symposium : 21-24 November 2016, Hiroshima, Japan
location of publication
Los Alamitos
publisher
IEEE
year of publication
2016
pages
p. 304-309 : ill
conference name, date
25th Asian Test Symposium, 21-24 November, 2016
conference location
Hiroshima, Japan
url
https://doi.org/10.1109/ATS.2016.57
subject term
protsessorid
arvuti arhitektuur
elutsüklid (tehnika)
Scopus
https://www.scopus.com/sourceid/14494
https://www.scopus.com/record/display.uri?eid=2-s2.0-85010190419&origin=inward&txGid=94278d8f3fdc4662a5660d06c967d131
WOS
https://www.webofscience.com/wos/woscc/full-record/WOS:000391554900058
quartile
Q2
category (general)
Engineering
Tehnika
category (sub)
Engineering. Electrical and electronic engineering
Tehnika. Elektri- ja elektroonikatehnika
keyword
hardware rejuvenation
aging
NBTI
critical path identification
processor designs
evolutionary computation
ISSN
2377-5386
ISBN
978-1-5090-3808-4
notes
Bibliogr.: 37 ref
scientific publication
teaduspublikatsioon
classifier
3.1
TalTech department
arvutitehnika instituut
language
inglise