Searching - TalTech Research Portal

Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles

Research Groups

Help and information

Searching

critical path identification (keyword)

—

—

—

—

Add criteria Advanced search filter

Clear

types of item

book ..

journal article ..

newspaper article ..

book article ..

dissertation ..

Open Access ..

Scientific publications ..

year

year of publication

Loading..

Loading..

TalTech department

Loading..

Loading..

Loading..

name of the person

Loading..

Loading..

Clear

Number of records 4
Look more.. (1/123)
Export

export all inquiry results (4)
Save TXT fail

print
Open for editing with marked entries my bookmarks

display

sort
1

book article

Hierarchical identification of NBTI-critical gates in nanoscale logicKostin, Sergei; Raik, Jaan; Ubar, Raimund-Johannes; Jenihhin, MaksimLATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 20142014 / [6] p. : ill

book article
2

journal article EST / journal article ENG

Identification and rejuvenation of NBTI-critical logic paths in nanoscale circuitsJenihhin, Maksim; Squillero, Giovanni; Tihhomirov, Valentin; Kostin, Sergei; Raik, Jaan; Ubar, Raimund-JohannesJournal of electronic testing : theory and applications (JETTA)2016 / p. 273-289 : ill https://doi.org/10.1007/s10836-016-5589-x Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG
3

book article

Rejuvenation of nanoscale logic at NBTI-critical paths using evolutionary TPGPalermo, N.; Tihhomirov, Valentin; Copetti, Thiago; Jenihhin, Maksim; Raik, Jaan; Kostin, Sergei2015 16th Latin American Test Symposium (LATS 2015) : Puerto Vallarta, Mexico, 25-27 March 20152015 / [6] p. : ill http://dx.doi.org/10.1109/LATW.2015.7102405

book article
4

book article EST / book article ENG

Rejuvenation of NBTI-impacted processors using evolutionary generation of assembler programsPellerey, Francesco; Jenihhin, Maksim; Squillero, Giovanni; Raik, Jaan; Sonza Reorda, Matteo; Tihhomirov, Valentin; Ubar, Raimund-Johannes2016 IEEE 25th Asian Test Symposium : 21-24 November 2016, Hiroshima, Japan2016 / p. 304-309 : ill https://doi.org/10.1109/ATS.2016.57 Conference Proceedings at Scopus Article at Scopus Article at WOS

book article EST / book article ENG

Number of records 4, displaying 1 - 4

1. critical path identification
2. critical path
3. critical path fault tracing
4. critical path method
5. critical path tracing
6. fault simulation with critical path tracing
7. NBTI-critical path
8. Parallel Fault Simulation with Critical Path Backtracing
9. timing-critical path
10. path identification
11. critical area identification
12. control and data path tests
13. deformation path
14. development path
15. feasible path generation
16. helical path separation
17. human path rehabilitation
18. mean free path
19. minimal path
20. multi-path
21. NBTI-induced path delay estimation
22. path analyses
23. path dependency
24. path loss model
25. path planning
26. reaction path
27. shortest path
28. shortest-path
29. test path synthesis
30. tracking path
31. anatase critical particle size
32. critical communication
33. critical communications
34. critical computing
35. critical contextual empiricism
36. critical control points
37. critical data studies
38. critical disclosure analysis
39. critical discourse analysis
40. critical elements
41. Critical employees
42. critical evaluation
43. critical frequencies
44. critical health conditions
45. critical information infrastructure
46. critical infrastructure
47. critical infrastructure management
48. critical infrastructure protection
49. critical infrastructures
50. critical laboratory results
51. critical metals
52. critical micelle concentration
53. critical nodes
54. critical political economy
55. critical psychology
56. critical ratsionalism
57. Critical Raw Materials
58. Critical realism
59. critical research
60. critical review
61. critical Reynolds number
62. critical situations
63. critical success factors
64. critical success factors (CSF)
65. critical theory of technology
66. critical thinking
67. critical thinking in IT
68. critical-sized defects
69. lifecritical services
70. minor critical metals
71. mixed-critical system
72. NBTI-critical gate
73. optimized routing approach for critical and emergency networks
74. optimized routing approach for critical and emergency networks simulations
75. safety critical systems
76. safety-critical
77. safety-critical applications
78. timing-critical paths
79. Automatic identification system
80. automatic identification system (AIS)
81. Autonomous Identification System (AIS)
82. brand community identification
83. brand identification
84. brand origin identification
85. change point identification
86. closed-loop identification
87. defect identification
88. digital identification
89. electronic identification
90. eyewitness identification
91. identification
92. identification cards
93. identification of military objects
94. identification of unbalance voltage source
95. identification of voltage unbalance sources
96. identification patterns
97. identification problems
98. identification via heteroskedasticity
99. language identification
100. medicinal product identification
101. message identification
102. metaverse identification
103. model identification
104. mould identification
105. nonlinear model identification
106. parameter identification
107. patient identification techniques
108. phase identification
109. radio frequency identification
110. root identification
111. Satellite Autonomous Identification System (SAIS)
112. seismic signal identification
113. self-identification
114. speaker identification
115. species identification
116. structural identification
117. sustem identification
118. system identification
119. taxonomical identification
120. thermal behavior identification
121. threat identification
122. vehicle identification
123. yeast identification

match

sort

Otsing
Valikud 0

year of publication

author

TalTech department

subject term

series

name of the person

keyword

TalTech Library

Akadeemia tee 1

13519

TalTech homepage TalTech Library homepage Digital Collection of TalTech Library Digiteek Repository

6203551

data@taltech.ee

TalTech Raamatukogu