A synthesis-agnostic behavioral fault model for high gate-level fault coverage
author
statement of authorship
Anton Karputkin, Jaan Raik
source
Proceedings of the 2016 Design, Automation & Test in Europe Conference & Exhibition (DATE) : 14-18 March 2016, ICC, Dresden, Germany
location of publication
[S.l.]
publisher
year of publication
pages
p. 1124-1127 : ill
conference name, date
2016 Design, Automation & Test in Europe Conference & Exhibition (DATE), 14-18 March, 2016
conference location
Dresden, Germany
ISSN
1558-1101
ISBN
978-3-9815370-6-2
notes
Bibliogr.: 19 ref
TTÜ department
language
inglise
subject term
Karputkin, A., Raik, J. A synthesis-agnostic behavioral fault model for high gate-level fault coverage // Proceedings of the 2016 Design, Automation & Test in Europe Conference & Exhibition (DATE) : 14-18 March 2016, ICC, Dresden, Germany. [S.l.] : EDAA, 2016. p. 1124-1127 : ill.