A BIST scheme for testing mixed analogue and digital circuits
author
Robson, Malcolm
Russel, Gordon
statement of authorship
M.Robson, G.Russel
source
BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings
location of publication
[Tallinn]
year of publication
1996
pages
p. 183-186: ill
ISBN
9985-59-026-0
notes
Bibl. 5 ref