Exact static compaction of sequential circuit tests using branch-and-bound and search state registration
statement of authorship
Jaan Raik, Artur Jutman, Raimund Ubar
location of publication
[S.l.]
year of publication
pages
p. 19-20
notes
Bibliogr.: 6 ref
Raik, J., Jutman, A., Ubar, R. Exact static compaction of sequential circuit tests using branch-and-bound and search state registration // ETW'02 : 7th IEEE European Test Workshop, Gorfu Greece, May 26-29, 2002 : informal digest. [S.l.], 2002. p. 19-20.