Computer-aided examination of the I²L current source and the behaviour of the I²L flip-flop used in static memory cells

author
statement of authorship
T. Rang
publisher
journal volume number month
vol. 25, no. 2
year of publication
pages
p. 159-165 : joon
ISSN
0324-6000
notes
Bibliogr.: 6 nim.
TTÜ department
language
inglise