print

Greedy alternative for the static compaction of sequential circuit test sequences

author
Raik, Jaan
statement of authorship
J.Raik
source
The 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings
location of publication
[Tallinn]
publisher
Tallinn Technical University
year of publication
2000
pages
p. 133-136 : ill
ISBN
9985-59-179-8
notes
Bibliogr.: 8 ref
Raik, J. Greedy alternative for the static compaction of sequential circuit test sequences // The 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings. [Tallinn] : Tallinn Technical University, 2000. p. 133-136 : ill.