Greedy alternative for the static compaction of sequential circuit test sequences
autor
vastutusandmed
J.Raik
ilmumiskoht
[Tallinn]
kirjastus/väljaandja
ilmumisaasta
leheküljed
p. 133-136 : ill
ISBN
9985-59-179-8
märkused
Bibliogr.: 8 ref
keel
inglise
Raik, J. Greedy alternative for the static compaction of sequential circuit test sequences // The 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings. [Tallinn] : Tallinn Technical University, 2000. p. 133-136 : ill.