prindi

Greedy alternative for the static compaction of sequential circuit test sequences

autor
Raik, Jaan
vastutusandmed
J.Raik
allikas
The 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings
ilmumiskoht
[Tallinn]
kirjastus/väljaandja
Tallinn Technical University
ilmumisaasta
2000
leheküljed
p. 133-136 : ill
märksõna
elektriahelad
algoritmid
ISBN
9985-59-179-8
märkused
Bibliogr.: 8 ref
keel
inglise
Raik, J. Greedy alternative for the static compaction of sequential circuit test sequences // The 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings. [Tallinn] : Tallinn Technical University, 2000. p. 133-136 : ill.