Explorations in low area overhead DfT techniques for sequential BIST
statement of authorship
Jaan Raik, Rein Raidma, Raimund Ubar
location of publication
[S. l.]
year of publication
pages
p. 220-223 : ill
ISBN
87-982637-5-7
notes
Bibliogr.: 12 ref
Raik, J., Raidma, R., Ubar, R.-J. Explorations in low area overhead DfT techniques for sequential BIST // IEEE NORCHIP 2003 : 21 Norchip Conference : Riga, Latvia, 10-11 November 2003 : proceedings. [S. l.], 2003. p. 220-223 : ill.