Hierarchical concurrent test generation for synchronous sequential circuits
author
Ubar, Raimund-Johannes
Brik, Marina
statement of authorship
R.Ubar, M.Brik
source
Proceedings of the 7th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2000 : Gdynia, Poland, 15-17 June 2000
location of publication
[S. l.]
year of publication
2000
pages
p. 533-538 : ill
ISBN
83-87202-37-1
notes
Bibliogr.: 6 ref