Multiple-objective backtrace for solving test generation constraints
author
Mekler, A.
Raik, Jaan
statement of authorship
A.Mekler, J.Raik
source
International Symposium on System-on-Chip : November 19-21, 2003, Tampere, Finland : proceedings
location of publication
Tampere
year of publication
2003
pages
p. 123-126 : ill
url
https://ieeexplore.ieee.org/document/1267732
subject term
elektriahelad
rikked
testimine
Boole'i funktsioonid
järjendanalüüs
ISBN
0-7803-8160-2
notes
Bibliogr.: 9 ref
language
inglise