A novel artificial neural networks based automatic adaptive fault detection technique for analog circuits
author
Petlenkov, Eduard
Jutman, Artur
Nõmm, Sven
Ubar, Raimund-Johannes
statement of authorship
E.Petlenkov, A.Jutman, S.Nõmm, R.Ubar
source
BEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia
location of publication
[Tallinn]
publisher
Tallinn University of Technology
year of publication
2008
pages
p. 167-170 : ill
subject term
tehisnärvivõrgud
signaalid
analoogintegraallülitused
rikked
testimine
ISBN
978-1-4244-2059-9
notes
Bibliogr.: 9 ref
language
inglise