Scalable algorithm for structural fault collapsing in digital circuits
statement of authorship
Raimund Ubar, Lembit Jürimägi, Elmet Orasson, Jaan Raik
source
2015 IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC) : October 5-7, 2015, Daejeon, Korea
location of publication
[S.l.]
publisher
year of publication
pages
p. 171-176 : ill
conference name, date
2015 IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC), October 5-7, 2015
conference location
Daejeon, Korea
ISBN
978-1-4673-9140-5
notes
Bibliogr.: 24 ref
TTÜ department
language
inglise
Ubar, R., Jürimägi, L., Orasson, E., Raik, J. Scalable algorithm for structural fault collapsing in digital circuits // 2015 IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC) : October 5-7, 2015, Daejeon, Korea. [S.l.] : IEEE, 2015. p. 171-176 : ill.