GA-based test generation for sequential circuits
author
Brik, Marina
Raik, Jaan
Ubar, Raimund-Johannes
Ivask, Eero
statement of authorship
M. Brik, J. Raik, R. Ubar, E. Ivask
source
Proceedings of East–West Design & Test Workshop (EWDTW’04) : Yalta, Alushta, Crimea, Ukraine, September 23-26, 2004
location of publication
[Kharkov]
year of publication
2004
pages
p. 30-34
conference name, date
2nd East-West Design & Test Workshop, 23-26 September, 2004
conference location
Yalta, Alushta, Crimea, Ukraine
ISBN
966-659-088-3
TTÜ department
arvutitehnika instituut
language
inglise