Temperature dependence of very deep emission from an exciton bound to an isoelectronic defect in polycrystalline CuInS2
statement of authorship
J.Krustok, J.Raudoja, R.Jaaniso
source
journal volume number month
89
year of publication
pages
5, p. 051905 ([3] p.) : ill
ISSN
0003-6951
language
inglise
Krustok, J., Raudoja, J., Jaaniso, R. Temperature dependence of very deep emission from an exciton bound to an isoelectronic defect in polycrystalline CuInS2 // Applied physics letters (2006) 89, 5, p. 051905 ([3] p.) : ill.