Temperature dependence of very deep emission from an exciton bound to an isoelectronic defect in polycrystalline CuInS2
vastutusandmed
J.Krustok, J.Raudoja, R.Jaaniso
allikas
ajakirja aastakäik number kuu
89
ilmumisaasta
leheküljed
5, p. 051905 ([3] p.) : ill
ISSN
0003-6951
keel
inglise
Krustok, J., Raudoja, J., Jaaniso, R. Temperature dependence of very deep emission from an exciton bound to an isoelectronic defect in polycrystalline CuInS2 // Applied physics letters (2006) 89, 5, p. 051905 ([3] p.) : ill.