An approach for verification assertions reuse 2 in RTL test pattern generation
author
Jenihhin, Maksim
Raik, Jaan
Ubar, Raimund-Johannes
Viilukas, Taavi
Fujiwara, Hideo
statement of authorship
Maksim Jenihhin, Jaan Raik, Raimund Ubar, Taavi Viilukas, Hideo Fujiwara
source
Journal of Shanghai Normal University : Natural Sciences
journal volume number month
Vol. 39, No. 5
year of publication
2010
pages
p. 441-447 : ill
conference name, date
IEEE Eleventh Workshop on RTL and High Level Testing, 5-6 December 2010
conference location
Shangai
url
https://www.researchgate.net/publication/240613999_An_Approach_for_Verification_Assertions_Reuse_in_RTL_Test_Pattern_Generation
subject term
komplekssüsteemid
töökindlus
testimine
ISSN
1000-5137
notes
Bibliogr.: 25 ref
Kokkuvõte hiina keeles
language
inglise