Hierarchical test generation. SEMI show slides
author
Ubar, Raimund-Johannes
Raik, Jaan
statement of authorship
R. Ubar, J. Raik
source
"Test, Assembly and Packaging" : SEMICON Technical Symposium : Singapur, May 3-6, 1999
location of publication
[S.l.]
publisher
SEMI
year of publication
1999
pages
p. 53-64
subject term
testimine
testid
digitaaltehnika
language
inglise