A comprehensive methodology for stress procedures evaluation and comparison for Burn-In of automotive SoC
author
Appello, D.
Bernardi, P.
Giacopelli, G.
Ruberg, Priit
statement of authorship
D. Appello, P. Bernardi, G. Giacopelli, A. Motta, A. Pagani, G. Pollaccia, C. Rabbi, M. Restifo, P. Ruberg, E. Sanchez, C.M. Villa, F. Venini
source
Proceedings of the 2017 Design, Automation & Test in Europe (DATE) : 27-31 March 2017, Swisstech, Lausanne, Switzerland
location of publication
[S.l.]
publisher
IEEE
year of publication
2017
pages
p. 646-649 : ill
conference name, date
2017 Design, Automation & Test in Europe (DATE), 27-31 March, 2017
conference location
Lausanne, Switzerland
url
https://doi.org/10.23919/DATE.2017.7927068
subject term
autoosad
elektroonikakomponendid
pinge (elektrotehnika)
testimine
keyword
Burn-In
scan-based stress
functional stress programs
stress coverage
ISSN
1558-1101
ISBN
978-3-9815370-8-6
notes
Bibliogr.: 10 ref
TalTech department
arvutisüsteemide instituut
language
inglise