On antagonism between side-channel security and soft-error reliability in BNN inference engines
author
Lai, Xinhui
Lange, Thomas
Balakrishnan, Aneesh
Alexandrescu, Dan
Jenihhin, Maksim
statement of authorship
Xinhui Lai, Thomas Lange, Aneesh Balakrishnan, Dan Alexandrescu, Maksim Jenihhin
source
IFIP/IEEE 29th International Conference on Very Large Scale Integration (VLSI-SoC)
publisher
IEEE
year of publication
2021
pages
p. 1-6
conference name, date
IFIP/IEEE 29th International Conference on Very Large Scale Integration (VLSI-SoC), 04-07 October 2021
conference location
Singapore
url
https://doi.org/10.1109/VLSI-SoC53125.2021.9606981
subject term
tehisnärvivõrgud
kvaliteet
kübersõda
keyword
Binarized Neural Network (BNN)
soft-error reliability
logical de-rating
side-channel attack
Differential Power Analysis (DPA)
ISSN
2324-8440
ISBN
978-1-6654-2614-5
scientific publication
teaduspublikatsioon
classifier
3.1
TalTech department
arvutisüsteemide instituut
language
inglise
Reserch Group
Centre for trustworthy and efficient computing hardware (TECH)
Centre of dependable computing systems