Understanding fault-tolerance vulnerabilities in advanced SoC FPGAs for critical applications
author
Cherezova, Natalia
Shibin, Konstantin
Jenihhin, Maksim
Jutman, Artur
statement of authorship
Natalia Cherezova, Konstantin Shibin, Maksim Jenihhin, Artur Jutman
source
Microelectronics reliability
publisher
Elsevier
journal volume number month
vol. 146
year of publication
2023
pages
art. 115010, 10 p. : ill
url
https://doi.org/10.1016/j.microrel.2023.115010
subject term
töökindlus
kiirendid
rikked
tulemused
veakindlus
tõrketaluvus
keyword
cross-layer reliability
fault effects
fault-tolerance
SoC FPGA
soft errors
ISSN
0026-2714
notes
Bibliogr.: 75 ref
Open Access
Open Access
scientific publication
teaduspublikatsioon
classifier
1.1
Scopus
https://www.scopus.com/sourceid/26717
https://www.scopus.com/record/display.uri?eid=2-s2.0-85159638800&origin=inward&txGid=5c8c991b1cc2020860e81a21c25c1f79
WOS
https://jcr.clarivate.com/jcr-jp/journal-profile?journal=MICROELECTRON%20RELIAB&year=2023
https://www.webofscience.com/wos/woscc/full-record/WOS:001001810500001
category (general)
Engineering
Tehnika
Physics and astronomy
Füüsika ja astronoomia
Materials science
Materjaliteadus
category (sub)
Engineering. Safety, risk, reliability and quality
Tehnika. Ohutus, risk, töökindlus ja kvaliteet
Engineering. Electrical and electronic engineering
Tehnika. Elektri- ja elektroonikatehnika
Physics and astronomy. Atomic and molecular physics, and optics
Füüsika ja astronoomia. Aatomi- ja molekulaarfüüsika ning optika
Physics and astronomy. Condensed matter physics
Füüsika ja astronoomia. Kondenseeritud aine füüsika
Materials science. Surfaces, coatings and films
Materjaliteadus. Pinnad, katted ja kiled
Materials science. Electronic, optical and magnetic materials
Materjaliteadus. Elektroonilised, optilised ja magnetilised materjalid
quartile
Q2
TalTech department
arvutisüsteemide instituut
language
inglise