Test generation for digital systems
author
Ubar, Raimund-Johannes
statement of authorship
Ubar, R.
source
Digest of papers - FTCS 13th Annual International Symposium on Fault-Tolerant Computing, June 28 - 30, 1983, Milano, Italy
location of publication
New York
publisher
IEEE Computer Soc. Press
year of publication
1983
pages
p. 374-377
conference name, date
13th Annual International Symposium on Fault-Tolerant Computing (FTCS), June 28 - 30, 1983
conference location
Milano
subject term
digitaaltehnika
testimine
TalTech department
elektronarvutite kateeder
language
inglise