Automated area and coverage optimization of minimal latency checkers
author
statement of authorship
Siavoosh Payandeh Azad, Behrad Niazmand, Apneet Kaur Sandhu, Jaan Raik, Gert Jervan, Thomas Hollstein
source
2017 22nd IEEE European Test Symposium (ETS 2017), Limassol, Cyprus, 22 – 26 May 2017 : proceedings
location of publication
Piscataway
publisher
year of publication
pages
p. 7-8 : ill
conference name, date
22nd IEEE European Test Symposium (ETS 2017), 22 - 26 May 2017
conference location
Limassol, Cyprus
ISSN
1530-1877
ISBN
978-1-5090-5458-9
notes
Bibliogr.: 5 ref
TTÜ department
language
inglise
subject term
Azad, S.P., Niazmand, B., Apneet Kaur, Raik, J., Jervan, G., Hollstein, T. Automated area and coverage optimization of minimal latency checkers // 2017 22nd IEEE European Test Symposium (ETS 2017), Limassol, Cyprus, 22 – 26 May 2017 : proceedings. Piscataway : IEEE, 2017. p. 7-8 : ill.