Toggle navigation
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Databases
Publications
Searching
My bookmarks
0
Apneet Kaur (author)
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
Add criteria
Advanced search
filter
Clear
×
types of item
book
..
journal article
..
newspaper article
..
book article
..
dissertation
..
Open Access
..
Scientific publication
..
year
year of publication
Loading..
author
Loading..
TTÜ department
Loading..
subject term
Loading..
series
Loading..
name of the person
Loading..
keyword
Loading..
Clear
Number of records
6
Look more..
(3/40)
Export
export all inquiry results
(6)
Save TXT fail
Save PDF fail
print
Open for editing with marked entries
my bookmarks
display
Bibliographic view
Short view
sort
author ascending
author descending
year of publication ascending
year of publication descending
title ascending
title descending
1
book article
Automated area and coverage optimization of minimal latency checkers
Azad, Siavoosh Payandeh
;
Niazmand, Behrad
;
Apneet Kaur
;
Raik, Jaan
;
Jervan, Gert
;
Hollstein, Thomas
2017 22nd IEEE European Test Symposium (ETS 2017), Limassol, Cyprus, 22 – 26 May 2017 : proceedings
2017
/
p. 7-8 : ill
https://doi.org/10.1109/ETS.2017.7968211
book article
2
book article EST
/
book article ENG
Energy-efficient multi-fragment Markov model guided online model-based testing for MPSoC
Vain, Jüri
;
Tsiopoulos, Leonidas
;
Kharchenko, Vyacheslav
;
Apneet Kaur
;
Jenihhin, Maksim
;
Raik, Jaan
;
Nõmm, Sven
Green IT Engineering: Social, Business and Industrial Applications
2019
/
p. 273-297
https://doi.org/10.1007/978-3-030-00253-4_12
Article collection at Scopus
Article at Scopus
book article EST
/
book article ENG
3
book article
From online fault detection to fault management in network-on-chips : a ground-up approach
Azad, Siavoosh Payandeh
;
Niazmand, Behrad
;
Janson, Karl
;
Nevin, George
;
Oyeniran, Adeboye Stephen
;
Putkaradze, Tsotne
;
Apneet Kaur
;
Raik, Jaan
;
Jervan, Gert
;
Ubar, Raimund-Johannes
;
Hollstein, Thomas
Proceedings 2017 IEEE 20th International Symposium on Design and Diagnotics of Electronic Circuit & Systems(DDECS) : April 19-21, 2017, Dresden, Germany
2017
/
p. 48-53 : ill
https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7934553
book article
4
book article
Modeling for multi-view interference analysis of design aspects in MPSoC designs
Vain, Jüri
;
Apneet Kaur
;
Tsiopoulos, Leonidas
;
Raik, Jaan
;
Jenihhin, Maksim
RESCUE 2017 : Workshop on Reliability, Security and Quality : ETS17 Fringe Workshop, May 25-26, 2017, Limassol, Cyprus
2017
/
p. 1-6
http://www.ets17.org.cy/workshop/rescue-workshop.html
book article
5
book article EST
/
book article ENG
Multi-fragment Markov model guided online test generation for MPSoC
Vain, Jüri
;
Tsiopoulos, Leonidas
;
Kharchenko, Vyacheslav
;
Apneet Kaur
;
Jenihhin, Maksim
;
Raik, Jaan
ICTERI 2017 : ICT in Education, Research and Industrial Applications. Integration, Harmonization and Knowledge Transfer : proceedings of the 13th International Conference on ICT in Education, Research and Industrial Applications. Integration, Harmonization and Knowledge Transfer, Kyiv, Ukraine, May 15-18, 2017
2017
/
p. 594-607 : ill
http://www.scopus.com/inward/record.uri?eid=2-s2.0-85020540459&partnerID=40&md5=af226e25c344c52689f23bf5c39cc267
http://ceur-ws.org/Vol-1844/10000594.pdf
Conference proceedings at Scopus
Article at Scopus
book article EST
/
book article ENG
6
book article
Multi-view modeling for MPSoC design aspects [Online resource]
Vain, Jüri
;
Apneet Kaur
;
Tsiopoulos, Leonidas
;
Raik, Jaan
;
Jenihhin, Maksim
BEC 2018 : 2018 16th Biennial Baltic Electronics Conference (BEC) : proceedings of the 16th Biennial Baltic Electronics Conference, October 8-10, 2018
2018
/
4 p.: ill
https://doi.org/10.1109/BEC.2018.8600986
book article
Number of records 6, displaying
1 - 6
author
20
1.
Apneet Kaur
2.
Balpreet Kaur
3.
Jaanson, Kaur
4.
Kaasik-Aaslav, Kaur
5.
Kaur, Balpreet
6.
Kaur, Harleen
7.
Kaur, Harsandaldeep
8.
Kaur, Helen
9.
Kaur, Kaiko
10.
Kaur, Katrin
11.
Kaur, Terje
12.
Koppel, Kaur
13.
Krusell, Kaur
14.
Kullman, Kaur
15.
Lohk, Kaur
16.
Maran, Kaur
17.
Muuli, Kaur
18.
Sarve, Kaur
19.
Tuttelberg, Kaur
20.
Väer, Kaur
CV
13
1.
Apneet Kaur 1988
2.
Apneet Kaur Sandhu
3.
Sandhu, Apneet Kaur
4.
Kaur, Apneet
5.
Kaur, Balpreet
6.
Kaur, Katrin
7.
Kaur, Katrin 1990
8.
Kaur, Paul 1908-1992
9.
Kullman, Kaur 1980
10.
Malhi, Avleen Kaur
11.
Sarv, Kaur 1979
12.
Tuttelberg, Kaur 1990
13.
Väer, Kaur 1988
name of the person
7
1.
Balpreet Kaur
2.
Jaanson, Kaur
3.
Kalmus, Kaur
4.
Kaur, Katrin
5.
Kullmann, Kaur
6.
Sarv, Kaur
7.
Tuttelberg, Kaur
×
vaste
starts with
ends with
containes
sort
Relevance
ascending
descending
year of publication
author
TTÜ department
subject term
series
name of the person
keyword
Otsing
Valikud
0
year of publication
AND
OR
NOT
author
AND
OR
NOT
TTÜ department
AND
OR
NOT
subject term
AND
OR
NOT
series
AND
OR
NOT
name of the person
AND
OR
NOT
keyword
AND
OR
NOT