DefSim: CMOS defects on chip for research and education
author
Pleskacz, Witold A.
Borejko, Tomasz
Walkanis, A.
Stopjakova, Viera
Jutman, Artur
Ubar, Raimund-Johannes
statement of authorship
W.A.Pleskacz, T.Borejko, A.Walkanis, V.Stopjakova, A.Jutman, R.Ubar
source
7th IEEE Latin American Test Workshop LATW'06 : Buenos Aires, Argentina, March 26th-29th, 2006 : proceedings
location of publication
Porto Alegre
publisher
Evangraf
year of publication
2006
pages
p. 74-79 : ill
subject term
integraallülitused
vead
uuringud
ISBN
85-7727-022-X
notes
Bibliogr.: 11 ref
language
inglise