Challenges of reliability assessment and enhancement in autonomous systems
statement of authorship
Maksim Jenihhin, Matteo Sonza Reorda, Aneesh Balakrishnan, Dan Alexandrescu
source
2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2019)
location of publication
[S.l.]
publisher
year of publication
pages
6 p
conference name, date
2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2-4 Oct. 2019
conference location
Noordwijk, Netherlands
subject term
ISSN
1550-5774
ISBN
978-1-7281-2261-8
notes
Bibliogr.: 45 ref
TTÜ department
language
inglise
Jenihhin, M., Reorda, M., Balakrishnan, A., Alexandrescu, D. Challenges of reliability assessment and enhancement in autonomous systems // 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2019). [S.l.] : IEEE, 2019. 6 p.