Challenges of reliability assessment and enhancement in autonomous systems
author
Jenihhin, Maksim
Sonza Reorda, Matteo
Balakrishnan, Aneesh
Alexandrescu, Dan
statement of authorship
Maksim Jenihhin, Matteo Sonza Reorda, Aneesh Balakrishnan, Dan Alexandrescu
source
2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2019)
location of publication
[S.l.]
publisher
IEEE
year of publication
2019
pages
6 p
conference name, date
2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2-4 Oct. 2019
conference location
Noordwijk, Netherlands
url
https://doi.org/10.1109/DFT.2019.8875379
subject term
usaldusväärsus
turvalisus
vead
autonoomsed robotid
standardmudel
keyword
reliability
safety
fault tolerance
autonomous systems
standards
ISSN
1550-5774
ISBN
978-1-7281-2261-8
notes
Bibliogr.: 45 ref
Open Access
Open Access
scientific publication
teaduspublikatsioon
classifier
3.1
TalTech department
arvutisüsteemide instituut
language
inglise
Reserch Group
Centre for trustworthy and efficient computing hardware (TECH)
Centre of dependable computing systems