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Electro-thermal simulations and forward surge current failure prediction for SiC diodes

author
Velmre, Enn
Udal, Andres
statement of authorship
E. Velmre, A. Udal
source
Program of 17th Nordic Semiconductor Meeting, Trondheim, Norwey, June 17-20, 1996
location of publication
[S.l.]
year of publication
1996
pages
p. 28
subject term
ränikarbiid
dioodid
elektrotermia
simulatsioon
TalTech department
elektroonikainstituut
language
inglise
Velmre, E., Udal, A. Electro-thermal simulations and forward surge current failure prediction for SiC diodes // Program of 17th Nordic Semiconductor Meeting, Trondheim, Norwey, June 17-20, 1996. [S.l.], 1996. p. 28.