Ivask, E., Raik, J., Ubar, R. - TalTech Research Portal

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Fault oriented test pattern generation for sequential circuits using Genetic Algorithms

author

Ivask, Eero

Raik, Jaan

Ubar, Raimund-Johannes

statement of authorship

Eero Ivask, Jaan Raik, Raimund Ubar

source

The 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings

location of publication

[Tallinn]

publisher

Tallinn Technical University

year of publication

2000

pages

p. 129-132 : ill

ISBN

9985-59-179-8

notes

Bibliogr.: 13 ref

language

inglise

Märksõnad ja võtmesõnad

subject term

geneetilised algoritmid

vead

Ivask, E., Raik, J., Ubar, R. Fault oriented test pattern generation for sequential circuits using Genetic Algorithms // The 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings. [Tallinn] : Tallinn Technical University, 2000. p. 129-132 : ill.