Untestable fault identification in sequential circuits using model-checking

statement of authorship
Jaan Raik, Hideo Fujiwara, Raimund Ubar, Anna Krivenko
source
Proceedings of the 17th Asian Test Symposium ATS 2008 : November 24-27, 2008, Sapporo, Japan
location of publication
Los Alamitos
year of publication
pages
p. 21-26 : ill
conference name, date
17th Asian Test Symposium, November 24-27, 2008
conference location
Sapporo, Japan
ISSN
1081-7735
ISBN
978-0-7695-3396-4
notes
Bibliogr.: 11 ref
TTÜ department
language
inglise
Raik, J., Fujiwara, H., Ubar, R.-J., Krivenko, A. Untestable fault identification in sequential circuits using model-checking // Proceedings of the 17th Asian Test Symposium ATS 2008 : November 24-27, 2008, Sapporo, Japan. Los Alamitos : IEEE Computer Society Press, 2008. p. 21-26 : ill. http://dx.doi.org/10.1109/ATS.2008.22