Test pattern generation for microprocessor systems on the alternative graph model
author
Ubar, Raimund-Johannes
statement of authorship
Ubar, R.
source
Proceedings of the 3rd Symposium of the IMEKO Technical Committee on Technical Diagnostics (TC10), held in Moscow, October 3 - 5, 1983
location of publication
Budapest
publisher
IMEKO
year of publication
1985
pages
p. 403-410
conference name, date
3rd Symposium of the IMEKO Technical Committee on Technical Diagnostics (TC10), October 3 - 5, 1983
conference location
Moscow, Russia
subject term
mikroprotsessorid
diagnostika (tehnika)
TTÜ department
elektronarvutite kateeder
language
inglise