Improved testability calculation for digital circuits
author
Ubar, Raimund-Johannes
Heinlaid, J.
Raun, L.
statement of authorship
R. Ubar, J. Heinlaid, L. Raun
source
19th NORCHIP Conference, Kista, Sweden, 12-13 November 2001 : proceedings
location of publication
[S.l.]
year of publication
2001
pages
p. 264-270 : ill
ISBN
87-982637-3-0
notes
Bibliogr.: 11 ref
language
inglise