New categories of Safe Faults in a processor-based Embedded System
author
Gürsoy, Cemil Cem
Jenihhin, Maksim
Oyeniran, Adeboye Stephen
Piumatti, Davide
Raik, Jaan
Sonza Reorda, Matteo
Ubar, Raimund-Johannes
statement of authorship
C. Gursoy, M. Jenihhin, A.S. Oyeniran, D. Piumatti, J. Raik, M. Sonza Reorda, R. Ubar
source
2019 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), Cluj-Napoca, Romania : proceedings
location of publication
Danvers
publisher
IEEE
year of publication
2019
pages
4 p. : ill
conference name, date
22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 24-26 April 2019
conference location
Cluj-Napoca, Romania
url
https://doi.org/10.1109/DDECS.2019.8724642
subject term
manussüsteemid
protsessorid
rikked
ISSN
2473-2117
ISBN
978-1-7281-0073-9
notes
Bibliogr.: 17 ref
TalTech department
arvutisüsteemide instituut
language
inglise
Reserch Group
Centre for trustworthy and efficient computing hardware (TECH)
Centre of dependable computing systems