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The measurement and tuning of SiC diode voltage doubler represented as diffusion-welded stack [Online resource]

author
statement of authorship
Jana Toompuu, Natalja Sleptsuk, Raul Land, Oleg Korolkov, Toomas Rang
source
publisher
year of publication
pages
4 p.: ill
conference name, date
16th Biennial Baltic Electronics Conference (BEC), October 8-10, 2018
conference location
Tallinn, Estonia
url
ISSN
1736-3705
ISBN
978-1-5386-7313-3
notes
Bibliogr.: 4 ref
TTÜ department
language
inglise
Reserch Group
Cognitronic lab-on-a-chip research group
Research laboratory for cognitronics
Measurement electronics research group
Toompuu, J., Sleptšuk, N., Land, R., Korolkov, O., Rang, T. The measurement and tuning of SiC diode voltage doubler represented as diffusion-welded stack [Online resource] // BEC 2018 : 2018 16th Biennial Baltic Electronics Conference (BEC) : proceedings of the 16th Biennial Baltic Electronics Conference, October 8-10, 2018. : IEEE, 2018. 4 p.: ill. https://doi.org/10.1109/BEC.2018.8600963