New built-in self-test scheme for SoC interconnect
author
Jutman, Artur
Ubar, Raimund-Johannes
Raik, Jaan
statement of authorship
Artur Jutman, Raimund Ubar, and Jaan Raik
source
The 9th World Multi-Conference on Systemics, Cybernetics and Informatics : WMSCI 2005 : July 10-13, 2005, Orlando, Florida, USA. Vol. IV
location of publication
[Orlando]
publisher
International Institute of Informatics and Systemics
year of publication
2005
pages
p. 19-24 : ill
ISBN
980-6560-56-6
notes
Bibliogr.: 26 ref
TTÜ department
arvutitehnika instituut
language
inglise