Incorporating service type in aging failure model of high voltage circuit breaker

statement of authorship
Sajjad Asefi, Jako Kilter, Mart Landsberg
source
2023 27th International Conference Electronics : proceedings
location of publication
Danvers
publisher
year of publication
pages
5 p
conference name, date
IEEE 27th International Conference ELECTRONICS 2023, 19th–21th June, 2023
conference location
Kaunas, Lithuania
keyword
notes
Bibliogr.: 18 ref
scientific publication
teaduspublikatsioon
classifier
3.1
language
inglise
Asefi, S., Kilter, J., Landsberg, M. Incorporating service type in aging failure model of high voltage circuit breaker // 2023 27th International Conference Electronics : proceedings. Danvers : IEEE, 2023. 5 p. https://doi.org/10.1109/IEEECONF58372.2023.10177602