Model based testing of distributed time critical systems
author
Vain, Jüri
Kanter, Gert
Srinivasan, Seshadhri
statement of authorship
Jüri Vain, Gert Kanter, Seshadhri Srinivasan
source
2017 6th International Conference on Reliability, Infocom Technologies and Optimization (Trends and Future Directions) (ICRITO 2017) : Noida, India 20-22 September 2017
location of publication
Piscataway
publisher
IEEE
year of publication
2017
pages
p. 99-105 : ill
conference name, date
6th International Conference on Reliability, Infocom Technologies and Optimization (ICRITO) (Trends and Future Directions), September 20-22, 2017
conference location
Noida, India
url
https://doi.org/10.1109/ICRITO.2017.8342406
subject term
tarkvaraarendus
testimine
ISBN
978-1-5090-3013-2
notes
Bibliogr.: 13 ref
TalTech department
tarkvarateaduse instituut
language
inglise