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Defect studies in Cu2ZnSnSe4 and Cu2ZnSn(Se0.75S0.25)4 by admittance and photoluminescence spectroscopy

author
statement of authorship
E. Kask, M. Grossberg, R. Josepson, P. Salu, K. Timmo, J. Krustok
source
publisher
journal volume number month
Vol. 16, 3
year of publication
pages
p. 992-996 : ill
url
ISSN
1369-8001
notes
Bibliogr.: 22 ref
scientific publication
teaduspublikatsioon
language
inglise
subject term
keyword
Cu2ZnSnSe4
Cu2ZnSn(Se0.75S0.25)4
admittance spectroscopy
photoluminescence spectroscopy
defects
Kask, E., Grossberg, M., Josepson, R., Salu, P., Timmo, K., Krustok, J. Defect studies in Cu2ZnSnSe4 and Cu2ZnSn(Se0.75S0.25)4 by admittance and photoluminescence spectroscopy // Materials science in semiconductor processing (2013) Vol. 16, 3, p. 992-996 : ill. https://doi.org/10.1016/j.mssp.2013.02.009